The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2005
Filed:
Oct. 02, 2002
Miwako Torii, Toyohashi, JP;
Setsuo Saito, Aichi-gun, JP;
Toshifumi Sumiya, Nukata-gun, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
An apparatus for examining an anterior-segment of an eye, capable of grasping each part of the anterior-segment of the eye three-dimensionally and the condition of the center of its pupil accurately. The apparatus is provided with a projection optical system for projecting slit light onto the anterior-segment, which has an optical axis of projection, an image-pickup optical system for picking up a cross-sectional image of the anterior-segment which is optical-sectioned by the projected slit light, which has an optical axis of image-pickup inclined toward the projection optical axis, and comprises an image-pickup lens and an image-pickup device arranged based on the Scheimpflug's rule, rotation means for rotating the projected slit light and the image-pickup optical system about the projection optical axis, and display means for displaying a three-dimensional image of the anterior-segment based on the cross-sectional images picked up at a plurality of angles and the image-pickup angles corresponding to the images.