The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2005
Filed:
Aug. 24, 2001
Applicants:
Mary Beth Kossuth, San Jose, CA (US);
Damian A. Hajduk, San Jose, CA (US);
Paul Mansky, San Francisco, CA (US);
Inventors:
Mary Beth Kossuth, San Jose, CA (US);
Damian A. Hajduk, San Jose, CA (US);
Paul Mansky, San Francisco, CA (US);
Assignee:
Symyx Technologies, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L005/04 ;
U.S. Cl.
CPC ...
Abstract
A method for screening fabric handle of an array of fabric samples (i.e., a plurality of fabric materials) comprising providing an array of at least two fabric samples, protruding the fabric samples through openings, and monitoring response of said fabric samples to the protrusions.