The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2005

Filed:

Nov. 21, 2001
Applicants:

Thomas Haberer, Darmstadt, DE;

Wolfgang Ott, Darmstadt, DE;

Inventors:

Thomas Haberer, Darmstadt, DE;

Wolfgang Ott, Darmstadt, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B005/28 ; G01N023/00 ; H01J037/317 ;
U.S. Cl.
CPC ...
Abstract

The invention relates to an apparatus and to a method for adapting the size of an ion beam spot in tumor irradiation. For that purpose, the apparatus has a raster scanning device composed of raster scanning magnets () for raster scanning the ion beam (). In addition, the apparatus comprises quadrupole magnets () determining the size of the ion beam spot, which quadrupole magnets () are arranged directly in front of the raster scanning magnets (), and finally two magnet power supply units () for the quadrupole doublet of the quadrupole magnets () determining the size of the ion beam spot, the apparatus having a control loop for obtaining current correction values, by comparing desired and actual values of the prevailing dimension of the beam, for two magnet power supply units () of the quadrupole doublet arranged directly in front of the raster scanning magnets (), for defined homogenization and/or for defined variation of the size of the ion beam spot.


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