The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2005

Filed:

Feb. 27, 2001
Applicants:

Stephan W. Wegerich, Glendale Heights, IL (US);

David R. Bell, Clarendon Hills, IL (US);

Xiao Xu, Wheaton, IL (US);

Inventors:

Stephan W. Wegerich, Glendale Heights, IL (US);

David R. Bell, Clarendon Hills, IL (US);

Xiao Xu, Wheaton, IL (US);

Assignee:

Smartsignal Corporation, Lisle, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B021/00 ;
U.S. Cl.
CPC ...
Abstract

An improved empirical model-based surveillance or control system for monitoring or controlling a process or machine provides identification of transitions between operational states. Empirical model-based estimates generated in response to receiving actual operational parameters are compared using a global similarity operator to the actual parameters to indicate whether the process or machine is operating in a stable state, or is in transition from one state to another.


Find Patent Forward Citations

Wegerich, Stephan. (2005). Global state change indicator for empirical modeling in condition based monitoring (U.S. Patent No. 6859739). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6859739

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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