The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2005
Filed:
Dec. 03, 2001
Applicant:
Ping Sun, Saitama, JP;
Inventor:
Ping Sun, Saitama, JP;
Assignee:
Fuji Photo Optical Co., Ltd., Saitama, JP;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/36 ; G06K009/46 ;
U.S. Cl.
CPC ...
Abstract
In a method of analyzing a fringe image, a mask is provided to a gap for separating a plurality of fringe image regions from each other, a virtual fringe distribution is once rendered to the mask region so as to yield a single fringe image, a fringe analysis is carried out thereafter, and then data of the mask region is deleted, so that the separated independent regions have a phase relationship therebetween, whereby information of the object to be observed is obtained at a high speed.
Sun, Ping. (2005). Method of analyzing fringe image having separate regions (U.S. Patent No. 6859566). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6859566
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