The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2005
Filed:
Nov. 18, 2002
Tasso R. M. Sales, Rochester, NY (US);
Tasso R. M. Sales, Rochester, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
Microlens arrays are defined with microlens elements that differ from each other in accordance with a probability distribution for shaping an optical beam having a prescribed intensity profile within a desired far-field scatter pattern. The differences include random variations in a sag profile corresponding to a surface shape of the microlenses, a boundary profile corresponding to a boundary of the microlenses, and a spatial distribution corresponding to the relative position of the microlenses within the array. The sag profile variations can be used to homogenize an intensity profile of the optical beam. The boundary profile variations within an irregular spatial distribution can be used to apply the prescribed intensity profile of the optical beam within the desired scatter pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile