The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2005

Filed:

Mar. 21, 2002
Applicants:

Yoshinori Iketaki, Oume, JP;

Masaaki Fujii, Okazaki, JP;

Takashige Omatsu, Yokohama, JP;

Kimihisa Yamamoto, Tokyo, JP;

Toshio Suzuki, Chiba, JP;

Inventors:

Yoshinori Iketaki, Oume, JP;

Masaaki Fujii, Okazaki, JP;

Takashige Omatsu, Yokohama, JP;

Kimihisa Yamamoto, Tokyo, JP;

Toshio Suzuki, Chiba, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B021/06 ;
U.S. Cl.
CPC ...
Abstract

A microscope includes a first light source to emit a first light to excite a molecule of a sample to a higher energy level vibration state which belongs to a lowest energy level electron state from the ground state, a second light source to emit a second light source to excite the molecule to a higher energy level quantum state from the higher energy vibration state, an optical system to overlap the first light and the second light partially on the sample, and an optical detector to detect a given fluorescence from the irradiated region of the first light and the second light on the sample.


Find Patent Forward Citations

Iketaki, Yoshinori. (2005). Super resolution microscope (U.S. Patent No. 6859313). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6859313

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