The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2005

Filed:

Mar. 02, 2001
Applicants:

Christopher F. Carney, Wilmington, DE (US);

Fred L. Ferguson, Wilmington, DE (US);

John R. Reader, Newark, DE (US);

Weidong Liu, West Chester, PA (US);

Inventors:

Christopher F. Carney, Wilmington, DE (US);

Fred L. Ferguson, Wilmington, DE (US);

John R. Reader, Newark, DE (US);

Weidong Liu, West Chester, PA (US);

Assignee:

TA Instruments-Waters LLC, New Castle, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N021/01 ;
U.S. Cl.
CPC ...
Abstract

The invention relates to a platen to be used with a sample tray of an automatic sampler. According to an aspect, the platen includes both electrically conductive and reflective areas that can be used to calibrate the sample tray. According to another aspect, calibration of the sample tray can be performed in all three dimensions. According to another aspect, the platen is used to calibrate the sample tray, including its height and the location of its wells. The platen may include electrically-responsive (i.e., conductive) and optically-responsive (i.e., reflective) areas that can be sensed by electrical sensors and optical sensors in order to compute the coordinates of representative wells.


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