The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2005
Filed:
Mar. 27, 2000
Applicant:
Eiji Ogawa, Kanagawa, JP;
Inventor:
Eiji Ogawa, Kanagawa, JP;
Assignee:
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G005/00 ; G09G005/02 ; G06K009/00 ;
U.S. Cl.
CPC ...
Abstract
The method for evaluating a quality of an image on a display device displays a test pattern having different contrast intensities on a display screen of the display, then determines a contrast intensity at which the test pattern is visually discernible and uses the thus determined contrast intensity as a value for evaluation of granularity on the display device. The method is optimal for achieving quantitative and objective visual evaluation of image quality, particularly, its granularity.