The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6858848 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 22, 2005

Filed:

Nov. 14, 2000
Applicant:

James Richard Tickner, Erskineville, AU;

Inventor:

James Richard Tickner, Erskineville, AU;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N023/01 ;
U.S. Cl.
CPC ...
Abstract

The specification describes an instrument and a method for determining information about an object (J), only one side of which is available for examination. The method involves exposing the object to gamma-rays and measuring the position and/or time of arrival of gamma-rays at a detector (D). The instrument includes a source of gamma-rays (S) located so that at least some gamma-rays impact upon the object, and a detector surrounded by a shield (C) having an aperture (A) for facing at the object to be studied. The detector is capable of measuring the position and/or time of arrival at the detector of gamma-rays passing through the aperture.


Find Patent Forward Citations

Tickner, James. (2005). Gamma-ray imaging (U.S. Patent No. 6858848). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6858848

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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