The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 22, 2005

Filed:

Feb. 11, 1999
Applicant:

Matthias Hartrumpf, Karlsruhe, DE;

Inventor:

Matthias Hartrumpf, Karlsruhe, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J003/14 ; H01J040/14 ; H01J005/16 ;
U.S. Cl.
CPC ...
Abstract

The invention relates to a laser scanner measurement system, comprising a transmission unit consisting of a laser, beam deflection unit and transmitting optical system, and a receiving part with a photodetector which is arranged in the focal plane of the optical system destined for the receiving beam path. The invention is characterized in that the scanner unit and receiving unit are arranged on the same side in relation to the object and the surface normal of the receiving optical system is parallel to the direction of radiation of the scanner unit, i.e. that the scanner and receiver beam path in the outer area at all times have the same optical axis or that the axes are displaced parallel to each other and perpendicular to the direction ofmovement of the laser beam.


Find Patent Forward Citations

Hartrumpf, Matthias. (2005). Laser scanner measurement system (U.S. Patent No. 6858836). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6858836

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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