The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2005

Filed:

Mar. 06, 2003
Applicants:

Katrina Garnett, Hillsborough, CA (US);

Prashant Gupta, Monterey, CA (US);

Robert Hagmann, Palo Alto, CA (US);

James E. Van Riper, Scotts Valley, CA (US);

Inventors:

Katrina Garnett, Hillsborough, CA (US);

Prashant Gupta, Monterey, CA (US);

Robert Hagmann, Palo Alto, CA (US);

James E. Van Riper, Scotts Valley, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F019/00 ;
U.S. Cl.
CPC ...
Abstract

Methods, apparatus and system programs are provided for holistic monitoring and troubleshooting an application where the application functionally depends upon a plurality of components on a network system and at least one of the plurality of components being selected from a group consisting of a network component, a hardware component, and a software component. The method includes collecting data from the components and analyzing data collected from the components to discover one or more issues in the components. The analyzing step includes considering domain knowledge of the components and considering the interrelationships and correlations between components working within the application. The method function includes diagnosing the issues in the components to determine an action plan.


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