The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
Jul. 31, 2002
Franz Chen, San Jose, CA (US);
Kuo-chung Lin, Fremont, CA (US);
Franz Chen, San Jose, CA (US);
Kuo-Chung Lin, Fremont, CA (US);
Turnstone Systems, Inc., Santa Clara, CA (US);
Abstract
Systems and methods to identify an event(s) representing a discontinuity in the impedance of a transmission line such as a wire cable using time domain reflectrometry (TDR) are presented. According to an exemplary embodiment, multiple layers of digital signal processing techniques are implemented in an algorithm that combats the smearing effect of a wide launch pulses with the reflection due to an event. The algorithm focuses on wavelet decomposition and additional post processing to produce a well-defined signal that allows easy identification of the reflected signal while preserving critical information, such as the location of the event and relative signal strength.