The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
Mar. 03, 2003
Applicants:
Akbar Monfared, Placerville, CA (US);
Steve Mastoris, El Dorado Hills, CA (US);
Rex Schrader, Roseville, CA (US);
Inventors:
Akbar Monfared, Placerville, CA (US);
Steve Mastoris, El Dorado Hills, CA (US);
Rex Schrader, Roseville, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F019/00 ;
U.S. Cl.
CPC ...
Abstract
A frequency margin testing blade is adapted for use in a bladed server. The testing blade is further adapted to provide one or more output clock signals for use as clock inputs to one or more server blades internal to the bladed server in which the testing blade is installed and/or one or more server blades external to the bladed server in which the testing blade is installed.