The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
May. 02, 2003
Albert Henry Roger Lonn, Beaconsfield, GB;
Jiang Hsieh, Brookfield, WI (US);
Charles William Stearns, New Berlin, WI (US);
Edward Henry Chao, Oconomowoc, WI (US);
Brian Grekowicz, Waukesha, WI (US);
Albert Henry Roger Lonn, Beaconsfield, GB;
Jiang Hsieh, Brookfield, WI (US);
Charles William Stearns, New Berlin, WI (US);
Edward Henry Chao, Oconomowoc, WI (US);
Brian Grekowicz, Waukesha, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
A method includes scanning an object in a first modality having a first field of view to obtain first modality data including fully sampled field of view data and partially sampled field of view data. The method also includes scanning the object in a second modality having a second field of view larger than the first field of view of obtain second modality data, and reconstructing an image of the object using the second modality data and the first modality partially sampled field of view data.