The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
Mar. 26, 2002
William I. Vogt, Baraboo, WI (US);
Michael J. Szulczewski, Middleton, WI (US);
Donald J. Wolf, Madison, WI (US);
William I. Vogt, Baraboo, WI (US);
Michael J. Szulczewski, Middleton, WI (US);
Donald J. Wolf, Madison, WI (US);
Prairie Technologies, Inc., Middleton, WI (US);
Abstract
Disclosed are microscopes, preferably confocal microscopes, that include aperture plates having one or more arrays of apertures defined therein. The aperture plate is disposed in a position within an incoming light beam such that the incoming light beam is spatially filtered as it passes through the array of apertures. In certain embodiments of the invention, the aperture plate is fixed and immovable, in others, the aperture plate is translatable within a plane of confocality.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile