The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
Mar. 07, 2003
Kenichi Takanashi, Chiba-ken, JP;
Kohji Sakai, Tokyo, JP;
Kenichi Takanashi, Chiba-ken, JP;
Kohji Sakai, Tokyo, JP;
Ricoh Company Ltd., Tokyo, JP;
Abstract
An optical scanning lens used in a multi-beam scanning optical apparatus including a first mechanism reforming the light beams into line images, a deflecting mechanism reforming the light beams into multiple scanning beams, and a second mechanism reforming the multiple scanning beams into scanning light spots running on a recording surface. The optical scanning lens has a refractive index profile and is included in the second optical mechanism, and satisfies a formula (m−1)×PLs×V/WLs≦2.3×10, where m is a number of light emission points, PLs is a pitch of the multiple beams, V represents the refractive index profile, W [mm] represents an effective recording width of the recording surface, and WLs represents an effective range of the optical scanning lens in the sub-scanning direction corresponding to the effective recording width W. An optical scanning apparatus or image forming apparatus may use the optical scanning apparatus.