The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
Oct. 23, 2002
Bernard Ruchet, Charlesbourg, CA;
Bernard Ruchet, Charlesbourg, CA;
EXFO Electro-Optical Engineering Inc., Vanier, CA;
Abstract
Apparatus for making wavelength-resolved polarimetric measurements comprises an interferometric source (), for example a broadband source () and an optical interferometer unit (), and a polarization generator unit () for generating different states of polarization of light received from the interferometric source and applying same to a device-under-test (). A polarimeter unit () receives and polarimetrically-analyzes light from the device-under-test, converts the polarimetrically-analyzed light into electrical signals, and, using Fast Fourier Transform numerical analysis, computes therefrom the wavelength-resolved polarimetric measurements. Placing the optical interferometer unit () 'upstream' not only of the device-under-test (), but also of the polarisation generator unit (), means that the latter substantially eliminates polarization dependent effects introduced by the former. The polarimeter () can still perform the necessary transformation even though the interferogram has been passed through the polarisation generator unit and the device-under-test.