The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2005

Filed:

Mar. 03, 2003
Applicants:

Aydogan Ozcan, Menlo Park, CA (US);

Michel J.f. Digonnet, Palo Alto, CA (US);

Gordon S. Kino, Stanford, CA (US);

Inventors:

Aydogan Ozcan, Menlo Park, CA (US);

Michel J.F. Digonnet, Palo Alto, CA (US);

Gordon S. Kino, Stanford, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N021/59 ;
U.S. Cl.
CPC ...
Abstract

A method measures a nolinearity profile of a sample with at least one sample surface and having a sample nonlinearity profile along a sample line through a predetermined point on the sample surface. The sample line is oriented perpendicularly to the sample surface. The method includes measuring a Fourier transform of the sample nonlinearity profile and obtaining a reference nonlinearity profile from a reference material. The method includes forming a first composite sample having a first composite nonlinearity profile and forming a second composite sample having a second composite nonlinearity profile inequivalent to the first composite nonlinearity profile. The method further includes measuring a Fourier transform of the first composite nonlinearity profile and measuring a Fourier transform of the second composite nonlinearity profile. The method further includes calculating the sample nonlinearity profile using the Fourier transforms of the sample nonlinearity profile, the reference nonlinearity profile, the first composite nonlinearity profile, and the second composite nonlinearity profile.


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