The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2005

Filed:

Jan. 31, 2002
Applicant:

Nobuaki Ono, Yokohama, JP;

Inventor:

Nobuaki Ono, Yokohama, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J002/385 ; G03G013/04 ;
U.S. Cl.
CPC ...
Abstract

An optical scanning device for scanning plural surfaces including a plurality of laser light units each configured to emit a laser beam, a deflecting device configured to deflect the laser beams from the plurality laser light units to sweep a plurality of predetermined planes, respectively, and a scanning image forming optical unit configured to project the laser beams deflected by the deflecting device on the plural surfaces, respectively, to scan the plural surfaces with the laser beams. The scanning image forming optical unit includes a plurality of optical detecting devices configured to detect the laser beams and a first plurality of reflecting devices positioned to reflect at least two laser beams of the laser beams toward one of the plurality of optical detecting devices.


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