The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
Nov. 18, 2003
Scott Alexander Billington, Atlanta, GA (US);
Jonathan Lee Geisheimer, Mableton, GA (US);
Scott Alexander Billington, Atlanta, GA (US);
Jonathan Lee Geisheimer, Mableton, GA (US);
Radatec, Inc., Atlanta, GA (US);
Abstract
Calibrating the measurement of a distance between a transceiver and an object such as a radiating element (antenna) or a target by continuously changing the wavelength (frequency) of the transmitted wave and observing the rate of phase shift as a function of change in wavelength. The rate of phase shift change as a function of wavelength can be mathematically related to the total displacement to the reflecting object. This calibration technique is applicable to a sensing device comprising a transceiver configured to transmit a signal toward an object, detectors offset in phase to receive the transmitted signal and a reflected signal, and a processor configured with logic to measure a rate of phase shift proportional to the change in wavelength between the transmitted signal and the reflected signal at the detectors. The processor can be further configured with logic to relate the phase shift to displacement between the transceiver and the reflecting object.