The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
Oct. 01, 2003
Paul H. Fontaine, Richardson, TX (US);
Abdellatif Bellaouar, Dallas, TX (US);
Paul H. Fontaine, Richardson, TX (US);
Abdellatif Bellaouar, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
The present invention provides a system for providing high-resolution calibration of a programmable semiconductor component (). The system calibrates the programmable semiconductor component, within a desired accuracy, to a goal value (). The system provides a primary DAC function () and a supplemental DAC function (), as well as a control function (). The control function is utilized to determine a first bit step () of the primary DAC function that corresponds to the goal value. The control function then determines a second bit step () of the supplemental DAC function that corresponds to the goal value. The bit codes of the first and second bit steps are combined by a summing function (), to provide a programming control word for the programmable semiconductor component.