The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2005

Filed:

Dec. 11, 2003
Applicants:

Yoon-gyu Song, Suwon, KR;

Ki-seok Jeon, Suwon, KR;

Inventors:

Yoon-gyu Song, Suwon, KR;

Ki-seok Jeon, Suwon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/02 ;
U.S. Cl.
CPC ...
Abstract

A test board is selectively usable as an interface between an integrated circuit device under test (DUT), such as a ball grid array package, and an automatic test equipment (ATE), and as an interface between a calibration apparatus and the ATE. The test board includes a socket, for electrically connecting to the ATE, which includes a plurality of contact terminals which are configured to directly contact terminals of the DUT during a test operation and to directly contact probes of the calibration apparatus during a calibration operation. The test board also includes an alignment mark which is positioned adjacent the socket and which can be sensed by the calibration apparatus during the calibration operation, and a test pad which is positioned adjacent the socket and which is configured to directly contact a test probe of the calibration apparatus for checking an operational state of the calibration apparatus.


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