The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2005

Filed:

Nov. 17, 2003
Applicants:

Gabriele Fichtl, München, DE;

Jana Haensel, Dresden, DE;

Thomas Metzdorf, Dresden, DE;

Thomas Morgenstern, Dresden, DE;

Inventors:

Gabriele Fichtl, München, DE;

Jana Haensel, Dresden, DE;

Thomas Metzdorf, Dresden, DE;

Thomas Morgenstern, Dresden, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L021/8242 ;
U.S. Cl.
CPC ...
Abstract

A method for manufacturing a trench capacitor includes the step of etching a shallow isolation trench in a two-step process flow. During a first etching step, an etch chemistry based on chlorine or bromine performs a highly selective etch for silicon. During a second step, the etch chemistry is based on SiFand Owhich rather equally etches polysilicon and the collar isolation. On top of the wafer, the deposition of silicon oxide on the hard mask predominates and avoids an erosion of the hard mask. On the bottom of the trench the conformal etching of polysilicon and collar isolation predominates. The method provides an economic process flow and is suitable for small feature sizes.


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