The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 15, 2005
Filed:
Sep. 27, 2002
Hans-aloys Wischmann, Henstedt-Ulzburg, DE;
Michael Overdick, Langerwehe, DE;
Ralf Schmidt, Aachen, DE;
Roelant Visser, Eindhoven, NL;
Hans-Aloys Wischmann, Henstedt-Ulzburg, DE;
Michael Overdick, Langerwehe, DE;
Ralf Schmidt, Aachen, DE;
Roelant Visser, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a method for the correction or compensation of individual differences between the conversion characteristics of the image sensors () and the processing units () of an X-ray detector which are connected thereto. It is assumed that a functional relationship in conformity with GW=F(L(φ)) exists between the quantity of radiation (φ) entering the detector and the grey value (GW) resulting therefrom for a pixel (j, i), where Lij describes the approximately linear behavior of the sensor arrangement () and Fi the non-linear behavior of the processing unit (). For the inverse value La linear model function is used and for the inverse value Fa non-linear model function is used with parameters which can be calculated from calibration measurements with different radiation quantities (φ). During later operation of the detector these model functions can be applied to the grey values (GW) obtained in order to correct said grey values with a high precision and in real time, the storage space then required being small as a result of the use of a single non-linear inverse value for each column.