The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2005

Filed:

Feb. 28, 2001
Applicants:

Sadao Teranishi, Aichi, JP;

Kazuo Hirayama, Aichi, JP;

Satoru Nitta, Aichi, JP;

Masaaki Kobashi, Aichi, JP;

Mano Osamu, Aichi, JP;

Junji Yokoyama, Aichi, JP;

Inventors:

Sadao Teranishi, Aichi, JP;

Kazuo Hirayama, Aichi, JP;

Satoru Nitta, Aichi, JP;

Masaaki Kobashi, Aichi, JP;

Mano Osamu, Aichi, JP;

Junji Yokoyama, Aichi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B62D025/14 ;
U.S. Cl.
CPC ...
Abstract

The combination of a multi-layer instrument panel having a skin layer with an exposed surface and an opening therethrough and a first accessory that is mounted in the opening. The first accessory has an exposed surface that is substantially flush with the exposed surface of the skin layer with the first accessory mounted in the opening and operatively connected to the multi-layer instrument panel. The invention is also directed to a method of manufacturing the instrument panel with the first accessory.


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