The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2005

Filed:

Apr. 04, 2003
Applicant:

Craig A. Ayres, Lapeer, MI (US);

Inventor:

Craig A. Ayres, Lapeer, MI (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D021/00 ; G01D011/28 ; B60Q001/00 ; B60Q001/26 ;
U.S. Cl.
CPC ...
Abstract

A custom instrument gauge module is disclosed which replaces the OEM instrument cluster gauges sub-assembly and utilizes the original electronic circuitry for the unique customization of an existing instrument cluster. The custom gauge module is designed and calibrated to replace the original cluster graphics, gauges, and pointers, while maintaining the original cluster circuitry and, optionally, the molded housing. The flexible design and manufacturing of the custom gauge module allows the enhancement of existing instrument panels to have an upgraded appearance and additional functions, while maintaining and using the original cluster complex electronic circuit.


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