The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2005

Filed:

May. 25, 1999
Applicants:

Larry Apfelbaum, West Newton, MA (US);

Peter L. Savage, Mont Vernon, NH (US);

Mark Trumpler, Lexington, MA (US);

John D. Doyle, Hollis, NH (US);

Thomas Lynch, Hollis, NH (US);

Ramesh Vaswani, Nashua, NH (US);

Inventors:

Larry Apfelbaum, West Newton, MA (US);

Peter L. Savage, Mont Vernon, NH (US);

Mark Trumpler, Lexington, MA (US);

John D. Doyle, Hollis, NH (US);

Thomas Lynch, Hollis, NH (US);

Ramesh Vaswani, Nashua, NH (US);

Assignee:

Empirix Inc., Waltham, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F009/45 ;
U.S. Cl.
CPC ...
Abstract

A method of using a computer to analyze an extended finite state machine model of a system includes providing a graphical user interface that presents a table of rows, receiving data in at least one table row, and determining at least one path through the states and transitions of the extended finite state machine model using at least one of the rows in the table.


Find Patent Forward Citations

Apfelbaum, Larry. (2005). Analyzing an extended finite state machine system model (U.S. Patent No. 6853963). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6853963

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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