The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2005

Filed:

Apr. 17, 2003
Applicants:

Andreas Noe, Kerken, DE;

Rolf Noe, Mühlheim, DE;

Inventors:

Andreas Noe, Kerken, DE;

Rolf Noe, Mühlheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L001/00 ;
U.S. Cl.
CPC ...
Abstract

A method of measuring planarity of strip in a strip-rolling line or a strip-processing line in which a measuring beam, a plurality of measuring beams or discrete measuring pins in an inclined pattern across a measuring roller, measures the tension forces acting upon the strip to form a force summation foundation across the strip width. A tension distribution function is derived from the force summation function by taking derivatives of the force-summation function with respect to the width dimension of the strip and, if desired, dividing that derivative by the thickness of the strip.


Find Patent Forward Citations

Noe, Andreas. (2005). Method of and apparatus for measuring planarity of strip, especially metal strip (U.S. Patent No. 6853927). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6853927

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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