The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2005
Filed:
Feb. 22, 2001
Johan Trygg, Umeå, SE;
Svante Wold, Vännäs, SE;
Johan Trygg, Umeå, SE;
Svante Wold, Vännäs, SE;
Umetrics AB, Umeå, SE;
Abstract
The invention provides a method and an arrangement for filtering or pre-processing most any type of multivariate data exemplified by NIR or NMR spectra measured on samples in order to remove systematic noise such as base-line variation and multiplicative scatter effects. This is accomplished by differentiating the spectra to first or second derivatives, by Multiplicative Signal Correction (MSC), or by similar filtering methods. The pre-processing may, however, also remove information from the spectra, as well as other multiple measurement arrays, regarding (Y) (the response variables). Provided is a variant of PLS that can be used to achieve a signal correction that is as close to orthogonal as possible to a given (y) vector or (Y) matrix. Hence, ensuring that the signal correction removes as little information as possible regarding (Y). A filter according to the present invention is named Orthogonal Partial Least Squares (OPLS).