The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2005

Filed:

Mar. 25, 2002
Applicants:

Derek U. Gerlach, Palo Alto, CA (US);

Andrea Caprara, Menlo Park, CA (US);

Stephen P. Boyd, Stanford, CA (US);

Inventors:

Derek U. Gerlach, Palo Alto, CA (US);

Andrea Caprara, Menlo Park, CA (US);

Stephen P. Boyd, Stanford, CA (US);

Assignee:

Helios Photonics, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F001/01 ; G02B027/00 ;
U.S. Cl.
CPC ...
Abstract

A generalized tunable optical filter with interconnected processing devices, such as unequal arm Mach-Zehnder interferometric devices and ring resonator devices, is described. Each of the processing elements is characterized by a parametric length Δl=nΔlwhere nis an integer greater than 30 and Δlis the longest length common to all of the processing elements. The optical filter is tuned by the setting of actuators in the processing elements with each setting corresponding to a predetermined filter response, such as for chromatic dispersion compensation and WDM add/drop multiplexer applications. To determine the design variables of the optical filter, such as the coupling angles θ and parametric lengths Δlfor the processing elements, a methodology of determining these variables from the desired application is also described.


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