The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6853742 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 08, 2005

Filed:

Nov. 18, 2003
Applicants:

Yejia Wu, Midlothian, VA (US);

Nicholas Leoncavallo, Jr., Irmo, SC (US);

Thomas Yiu-tai Tam, Richmond, VA (US);

Inventors:

Yejia Wu, Midlothian, VA (US);

Nicholas Leoncavallo, Jr., Irmo, SC (US);

Thomas Yiu-Tai Tam, Richmond, VA (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K009/00 ;
U.S. Cl.
CPC ...
Abstract

Apparatus and method are described for measuring and controlling the crimp characteristics of a moving crimped tow. A light source illuminates a section of the moving crimped tow and at least one progressive scanning camera acquires a non-interlaced video image of the tow. The acquired image is digitized and a processor analyzes the non-interlaced image. Crimp characteristics are derived based on this analysis.


Find Patent Forward Citations

Wu, Yejia. (2005). Apparatus and method for characterizing fiber crimps (U.S. Patent No. 6853742). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6853742

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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