The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2005

Filed:

Jun. 11, 2002
Applicants:

Xinwei LI, Milpitas, CA (US);

Koichi Wago, Sunnyvale, CA (US);

David Shiao-min Kuo, Palo Alto, CA (US);

Inventors:

Xinwei Li, Milpitas, CA (US);

Koichi Wago, Sunnyvale, CA (US);

David Shiao-Min Kuo, Palo Alto, CA (US);

Assignee:

Seagate Technology LLC, Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B005/596 ;
U.S. Cl.
CPC ...
Abstract

A method for measuring servo pattern irregularity and other servo information of pre-patterned servo media mounted on a spindle with the center of the pre-pattern tracks off center from the axis rotation of the spindle. An actuator is stepped radially while measuring the PES signals from the servo sectors of at least one highly eccentric track to form a cross track profile of the PES signals for each sector. A mathematical algorithm removes step measurement error from the data. A second mathematical algorithm removes non-repeatable random noise from the data. The amount of phase-in that radially aligns the respective cross track profiles is computed. Servo pattern written-in repeatable runout is determined by unwrapping the phase-in values to form a periodic curve.


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