The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2005
Filed:
Dec. 18, 2003
Applicant:
Masato Kanao, Hachioji, JP;
Inventor:
Masato Kanao, Hachioji, JP;
Assignee:
Olympus Optical Co., Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B021/06 ;
U.S. Cl.
CPC ...
Abstract
In a microscope, an optical system that includes a zoom lens unit having a straight optical axis is located under a stage portion that carries a sample A thereon. An optical image of the sample A is projected on an image-pickup element via the optical system, and is converted into a picture signal by means of the image-pickup element. The picture signal is delivered to the outside through an external terminal area.
Kanao, Masato. (2005). Microscope (U.S. Patent No. 6853483). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6853483
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile