The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2005
Filed:
Sep. 04, 2001
Anders Bjarklev, Roskilde, DK;
Andreas Tycho, Copenhagen Ø, DK;
Peter E. Andersen, Frederiksberg, DK;
Anders Bjarklev, Roskilde, DK;
Andreas Tycho, Copenhagen Ø, DK;
Peter E. Andersen, Frederiksberg, DK;
Forskningscenter Riso, , DK;
Abstract
The present invention relates to an apparatus and a method for optical coherence reflectometry, in particular for optical coherence tomography. The invention particularly relates to the route of the light field in the sample arm. The reflected light field in the sample arm is amplified before being received by a combining means, said combining means being capable of receiving the reflected light field from the sample arm as well as the second reflected light field from the reference arm. Thereby, it is possible to direct substantially all light energy in the sample arm to the combining means, and to obtain fully the utilisation of the amplification of the reflected light field since preferably only the reflected light field is amplified by the optical amplifier. This leads to an improved signal-to-noise ratio (SNR) whereby an increase of the maximal penetration depth is obtained. Thereby, the apparatus is useful for obtaining optical biopsies of transparent as well as non-transparent tissues as well as new technical fields wherein the increased SNR allows the use of the present apparatus.