The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2005

Filed:

Jul. 25, 2003
Applicant:

Hans Kiening, Lenggries, DE;

Inventor:

Hans Kiening, Lenggries, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B041/00 ;
U.S. Cl.
CPC ...
Abstract

The invention relates to a test apparatus for the checking of the exposure quality of an exposed film, in particular of a motion film. A test pattern holder serves for the holding of a test pattern of the exposed film. A reference pattern with at least one reference mark is provided in superimposition with respect to the test pattern held by the test pattern holder. A light transmitter serves for the illumination of the test pattern held by the test pattern holder and of the reference pattern superimposed herewith. A light receiver is provided for the reception of the light transmitted through the reference pattern and through the test pattern and for the generation of corresponding electrical received signals. An evaluation device evaluates these received signals with respect to at least one quality parameter. The invention furthermore relates to a corresponding test method.


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