The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2005
Filed:
Oct. 22, 2001
Michiko Ueno, Niiza, JP;
Tooru Nakao, Tachikawa, JP;
Hidetoshi Iwasaki, Kawasaki, JP;
Yasushi Ariga, Fuchu, JP;
Youko Yamamoto, Tsukui-gun, JP;
Hakaru Nakagawa, Hino, JP;
Kiyoshi Yamaguchi, Hino, JP;
Tatsuko Akimoto, Nakano-ku, JP;
Masaaki Nagano, Koganei, JP;
Shinichi Izawa, Sagamihara, JP;
Shinsuke Watanabe, Hachioji, JP;
Michiko Ueno, Niiza, JP;
Tooru Nakao, Tachikawa, JP;
Hidetoshi Iwasaki, Kawasaki, JP;
Yasushi Ariga, Fuchu, JP;
Youko Yamamoto, Tsukui-gun, JP;
Hakaru Nakagawa, Hino, JP;
Kiyoshi Yamaguchi, Hino, JP;
Tatsuko Akimoto, Nakano-ku, JP;
Masaaki Nagano, Koganei, JP;
Shinichi Izawa, Sagamihara, JP;
Shinsuke Watanabe, Hachioji, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A graphics map of an area in which a system is set is displayed on a screen of a display unit, and minimized stations and line connecting between the stations are displayed on the map. Display colors of the station icon and the line icon are changed in accordance with presence/absence of a failure. When each station icon is clicked, a window showing a list of NODEs belonging to that station is opened, and a NODE having a failure and a NODE having no failure are also distinguished from each other by changing the display colors in this window.