The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2005
Filed:
Sep. 18, 2001
Mitsumasa Murakami, Tokyo, JP;
Masaya Hara, Tokyo, JP;
Mitsumasa Murakami, Tokyo, JP;
Masaya Hara, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Mitsubishi Electric Engineering Company, Tokyo, JP;
Abstract
The invention provides a temperature-compensating circuit which comprises first degree and second degree temperature-coefficient-generating circuits respectively comprising an operational amplifier and a plurality of resistors each having different temperature coefficient, a sign-inverting circuit, and first degree and second degree temperature-coefficient-adjusting circuits. Resistance values of the resistors of the first degree and second degree temperature-coefficient-generating circuits are decided so that voltage amplification factors are linearly or quadratically changed as a temperature changes. The sign-inverting circuit inverts signs of temperature coefficients generated by the first degree and second degree temperature-coefficient-generating circuits and the first degree and second degree temperature-coefficient-adjusting circuits adjust temperature coefficients generated by the first degree and second degree temperature-coefficient-generating circuits to predetermined values. The temperature-compensating circuit generates any temperature coefficients necessary for temperature compensation to cancel an offset drift constant in the temperature characteristic of a sensor output and fluctuation components due to span-shift first degree and second degree temperature coefficients.