The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2005

Filed:

Sep. 29, 2003
Applicant:

James G. Pipe, Peoria, AZ (US);

Inventor:

James G. Pipe, Peoria, AZ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V003/00 ;
U.S. Cl.
CPC ...
Abstract

A process and system to implement such a process is configured to determine diffusion properties within a region-of-interest. A metric or index of diffusion is determined from individual diffusion values corresponding to diffusion along, multiple diffusion directions relative to average diffusion at a related voxel or pair of voxels. The invention may be implemented to determine shared diffusion anisotropy between two voxels. Based on a value of a diffusion index or metric, the present invention provides an efficient and tensor-free technique of determining if diffusion in neighboring voxels is anisotropic and if the diffusion is oriented in the same direction within each voxel. The present invention may be used to rapidly determine fractional anisotropy in a single voxel or used to filter diffusion weighted imaging data. The present invention may also be used to color-code diffusion data such that diffusion and tract orientation are readily identifiable in a reconstructed image.


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