The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 08, 2005

Filed:

Mar. 09, 2001
Applicant:

Raul Fainchtein, Potomac, MD (US);

Inventor:

Raul Fainchtein, Potomac, MD (US);

Assignee:

The Johns Hopkins University, Baltimore, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V003/00 ;
U.S. Cl.
CPC ...
Abstract

Apparatus and method for detecting and quantifying magnetic field gradients by measuring the magnetic force acting on a mechanical oscillator with an attached spin-containing material (any material that displays a magnetic moment in the presence of a magnetic field) having a modulated magnetic moment with a temporal response that matches the resonance frequency of the mechanical oscillator. Modulation of the magnetic moment in the direction of the measurement is achieved by the action of a spatially uniform polarizing field with a temporal response that matches the resonance frequency of the mechanical oscillator.


Find Patent Forward Citations

Fainchtein, Raul. (2005). Force detected magnetic field gradiometer (U.S. Patent No. 6853187). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6853187

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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