The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2005
Filed:
Mar. 06, 2002
Siegfried Neumann, Kümmersbruck, DE;
Klaus Windsheimer, Spalt, DE;
Siegfried Neumann, Kümmersbruck, DE;
Klaus Windsheimer, Spalt, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
The invention relates to a measured value acquisition and processing unit () that facilitates the acquisition and processing of very small measuring signals in the range of interfering signals, such as, for example, noise, spillovers, etc. This means that the useful values to be detected usually contain interfering portions. The inventive measured value acquisition and processing unit () separately acquires these interfering portions by means of a switch element () disposed in the area of feed of the measured signals by means of which the measuring circuit is short-circuited in such a manner that the measured signal is not coupled in but only interfering signals that might occur in the measuring circuit are detected. The inventive method provides a large range of dynamic ratio for the detection of measured values at low costs.