The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2005
Filed:
Oct. 31, 2002
John J. Williams, Hartland, WI (US);
Dershan Luo, Brookfield, WI (US);
Mark K. Limkeman, Brookfield, WI (US);
Michael J. Cook, Oconomowoc, WI (US);
David L. Mcdaniel, Dousman, WI (US);
Edwin L. Oswalt, Waukesha, WI (US);
Mark P. Feilen, Mukwonago, WI (US);
John J. Williams, Hartland, WI (US);
Dershan Luo, Brookfield, WI (US);
Mark K. Limkeman, Brookfield, WI (US);
Michael J. Cook, Oconomowoc, WI (US);
David L. McDaniel, Dousman, WI (US);
Edwin L. Oswalt, Waukesha, WI (US);
Mark P. Feilen, Mukwonago, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method of calibrating detectors in a detector ring of a PET scanner, each detector including a plurality of crystals, the PET scanner having a field of view, is disclosed. The method comprises collecting timing data indicative of coincidence events occurring between each pair of crystals within the field of view. The method further comprises determining a detector adjustment value for each detector, determining a crystal adjustment value for each crystal in each detector, and discretizing the crystal adjustment value for each crystal to produce a discretized crystal adjustment value for each crystal. Lastly, the method comprises calibrating each detector by applying the discretized crystal adjustment value for each crystal in each detector to the collected timing data indicative of coincidence events.