The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2005
Filed:
Aug. 05, 1999
Richard L. Traber, Fremont, CA (US);
Li-jau Yang, San Jose, CA (US);
Richard L. Traber, Fremont, CA (US);
Li-Jau Yang, San Jose, CA (US);
3Com Corporation, Santa Clara, CA (US);
Abstract
An automatic scan test enable signal assertion system and method responds to transitions in signals communicated via selected pins that are not dedicated solely to testing operations. Pins are utilized to communicate a trigger signal and a stage progression signal. The trigger signal provides an indication to initiate a scan test enable signal assertion or deassertion and the stage progression signal controls the progress of the scan test enable activation or deactivation initiation. A scan test enable trigger sensing component provides an assertion or deassertion notification when logical values of a trigger signal captured during multiple stages provide an indication to begin a scan test enable signal assertion or deassertion. A staging component advances the logical values through stages in accordance with a progression signal and issues an asserted or deasserted scan test enable signal based upon the assertion or deassertion notification from the scan test enable trigger sensing component.