The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2005
Filed:
Oct. 18, 1999
Lee A. Barford, San Jose, CA (US);
Linda A. Kamas, Sunnyvale, CA (US);
Nicholas B. Tufillaro, San Francisco, CA (US);
Daniel A. Usikov, Foster City, CA (US);
Lee A. Barford, San Jose, CA (US);
Linda A. Kamas, Sunnyvale, CA (US);
Nicholas B. Tufillaro, San Francisco, CA (US);
Daniel A. Usikov, Foster City, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A method and apparatus that utilize time-domain measurements of a nonlinear device produce or extract a behavioral model from embeddings of these measurements. The method of producing a behavioral model comprises applying an input signal to the nonlinear device, sampling the input signal to produce input data, measuring a response of the device to produce output data, creating an embedded data set, fitting a function to the embedded data set, and verifying the fitted function. The apparatus comprises a signal generator that produces an input signal that is applied to the nonlinear device, the device producing an output signal in response. The apparatus further comprises a data acquisition system that samples and digitizes the input and output signals and a signal processing computer that produces an embedded data set from the digitized signals, fits a function to the embedded data set, and verifies the fitted function.