The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

Dec. 31, 2001
Applicants:

Koki Tanaka, Kyoto, JP;

Koichi Yamamoto, Settsu, JP;

Haruhiko Miyagawa, Kyoto, JP;

Inventors:

Koki Tanaka, Kyoto, JP;

Koichi Yamamoto, Settsu, JP;

Haruhiko Miyagawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 1904 ;
U.S. Cl.
CPC ...
Abstract

In a maintenance system for an analyzing instrument, a maintenance department remotely operates a first computer by a second computer to execute an initial inspection and a basic function inspection of the instrument. Then, an abnormality contained in the result information for every executed inspection is specified, and optimum maintenance information for solving the specified abnormality is searched in a server and extracted. Thereafter, the extracted maintenance information is sent to the first computer in the user side. Namely, an operator at the user side is only required to deal with the maintenance of the instrument in accordance with the maintenance information sent from the maintenance department.


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