The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2005
Filed:
Sep. 12, 2002
John T. Couchot, McKinney, TX (US);
John R. Davey, Plano, TX (US);
Joseph M. Donovan, San Diego, CA (US);
James D. Hall, Plano, TX (US);
Laura L. Wetzel, The Colony, TX (US);
Minzhi Wang, Plano, TX (US);
John T. Couchot, McKinney, TX (US);
John R. Davey, Plano, TX (US);
Joseph M. Donovan, San Diego, CA (US);
James D. Hall, Plano, TX (US);
Laura L. Wetzel, The Colony, TX (US);
Minzhi Wang, Plano, TX (US);
Electronic Data Systems Corporation, Plano, TX (US);
Abstract
Managing performance metrics includes accessing a metric catalog comprising a number of metrics, where each metric is associated with a threshold value. A selection of a subset of metrics of the number of metrics is received, and a service is defined using the subset of metrics. Metric values describing performance of the service are determined, where each metric value corresponds to a threshold value associated with a metric of the subset of metrics. The metric values and the corresponding threshold values are compared, and the performance of the service is evaluated in accordance with the comparison.