The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2005
Filed:
Jul. 13, 2001
Mario Ignagni, St. Paul, MN (US);
Dimitry Gorinevsky, Palo Alto, CA (US);
Mario Ignagni, St. Paul, MN (US);
Dimitry Gorinevsky, Palo Alto, CA (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
The present invention is directed to improving the accuracy with which a stationary array sensor provides cross directional measurements by providing an offset compensation to the stationary array sensor using the output of a scanning sensor associated with the manufacturing process. Exemplary embodiments correlate outputs from the stationary sensor array and the scanning array using a data reconciliation process. For example, a practical, real time data reconciliation of measurements from the scanning sensor and measurements from the stationary array sensor is achieved by computing offsets using a bank of Kalman filters to correlate outputs from the two sensors for each measurement zone, wherein each filter possesses a relatively simple computational structure. The Kalman filters can fuse the outputs from the stationary array sensor and the scanning sensor to track, and compensate, drift of the stationary array sensor.