The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2005
Filed:
Jul. 11, 2002
Shuuichi Fujikura, Tokyo, JP;
Masahiro Fukuda, Tokyo, JP;
Toyokazu Shiraishi, Tokyo, JP;
Tatsuya Murakami, Tokyo, JP;
Naoki Sunaga, Tokyo, JP;
Kiyoshi Matsuda, Tokyo, JP;
Shuuichi Fujikura, Tokyo, JP;
Masahiro Fukuda, Tokyo, JP;
Toyokazu Shiraishi, Tokyo, JP;
Tatsuya Murakami, Tokyo, JP;
Naoki Sunaga, Tokyo, JP;
Kiyoshi Matsuda, Tokyo, JP;
Oki Data Corporation, Tokyo, JP;
Abstract
A medium thickness detecting apparatus detects the thickness of a recording medium. A displacement section is disposed in a transport path through which a recording medium passes. When the recording medium passes the displacement section, the displacement section displaces in a direction substantially normal to the surface of a recording medium. An amplifying section amplifies a displacement of the displacement section by a predetermined factor. A thickness determining section outputs a signal representative of an amplified value of the displacement. The displacement section may be one of two rollers between which the recording medium passes, and displaces upward when the recording medium passes between the two rollers. Alternatively, the displacement section my be positioned to sit on a stage provided in the transport path such that the displacement section is pushed away from the stage when the recording medium passes between the displacement section and the surface.