The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2005

Filed:

Jun. 07, 2001
Applicants:

Kevin K. Lee, Cambridge, MA (US);

Desmond R. Lim, Cambridge, MA (US);

Kazumi Wada, Lexington, MA (US);

Lionel C. Kimerling, Concord, MA (US);

Inventors:

Kevin K. Lee, Cambridge, MA (US);

Desmond R. Lim, Cambridge, MA (US);

Kazumi Wada, Lexington, MA (US);

Lionel C. Kimerling, Concord, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 610 ;
U.S. Cl.
CPC ...
Abstract

A method of reducing the scattering losses that involves smoothing of the core/cladding interface and/or change of waveguide geometry in high refractive index difference waveguides. As an example, the SOI-based Si/SiOwaveguides are subjected to an oxidation reaction at high temperatures, after the waveguide patterning process. By oxidizing the rough silicon core surfaces after the patterning process, the core/cladding interfaces are smoothened, reducing the roughness scattering in waveguides.


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