The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2005
Filed:
Oct. 07, 1999
Frédéric Bevilacqua, Irvine, CA (US);
Christian Depeursinge, Lausanne, CH;
Frédéric Bevilacqua, Irvine, CA (US);
Christian Depeursinge, Lausanne, CH;
Ecole Polytechnique Federale de Lausanne, Lausanne, CH;
Abstract
We present a method and apparatus for local and superficial measurement of the optical properties of turbid media. The depth probed is on the order of 1 transport mean free path of the photon. The absorption coefficient, reduced scattering coefficient and the phase function parameter γ=(1−g)/(1−g) are optical parameters computed from a single measurement of the spatially resolved reflectance close to the source. Images of superficial structures of the medium can be obtained by performing multi-site measurements. An important application of this technique is the characterization of biological tissues, for example for medical diagnostic purposes. Measurements on biological tissues can be achieved using a probe of diameter less than 2 mm, and the average volume probed is on the order of 1 mm. Separate images of absorption and tissue structure can be achieved with a resolution of approximately one transport mean free path of the considered tissue.